Test devices are defined as all kinds of tools that a quality assurance employee requires in order to run a test (such as scales, photometer, hardness- or thickness tachymeter, and so on).
Test Device Groups are used to classify Test Devices and can be set up prior to or as needed when creating test devices.
To set up test device groups
- Choose the icon, enter Test Device Groups, and then choose the related link.
- Choose the New action.
- In the Code and Description fields, enter a unique code and description for the test device group.
- Go to the next line and add another test device group.
To set up test devices
On the Test Device Card, the master data of the test device that will be used to determine the actual values of the test properties is maintained.
- Choose the icon, enter Test Devices, and then choose the related link.
- Choose the New action.
- Fill in or update the fields as described in the following tables.
The fields on the General FastTab are described in the following table.
|No.||Unique identifier from the number series or manually entered if manual numbering is allowed.|
|Description||Description by which the test device is to be managed (scales, measure, etc.) within COSMO Quality Assurance.|
|Responsible||For every test device, a certain employee can be defined who is responsible for the proper use and maintenance of the device. Use the drop-down arrow to access the Users page.|
|Status||Indicates if a test device is released for processing tests or if it is blocked. Newly created test devices always have the status Certified whereas the status can be changed manually. The Status and Blocking Reason fields are automatically updated when the Block Test Devices batch job is run (see Block Test Devices).|
|Blocking Reason||Reason that the test device has been blocked.|
|Department||Assigns the test device to a certain department, such as workshop, laboratory, and so on.|
|Substitute Test Device||Turn on to indicate that the test device should be substituted with a new test device soon or can be used as a substitute for another test device. This field is used for informational purposes only.|
|Date of First Release||The first release date of a test device, used for determining the age of the device.|
The fields on the Testing FastTab display testing information.
|Test Cycle||Frequency in which the test device should be tested.|
|Last Test Date / Next Date Test Required||The formula from the Test Cycle field is used to calculate the date in the Next Date Test Required field, which is based on the date in the Last Test Date field.
If the date of the next test required has expired, the test device can be blocked using the “Block Test Devices” batch job and thus become subject of a test (see Block Test Devices).
|Default Test Plan No.||Standard test plan according to which the test device should be tested.
Note: This field must be populated to use the “Create Test Order” function on the “Block Test Devices” batch job (see Block Test Devices).
|Test Order Exist||Indicates if an active test order exists for the test device. This field will be set to Yes if a test order has been created by running the “Block Test Devices” batch job (see Block Test Devices).|
|Last Tester||Automatically populated with the ID of the user who finishes or cancels a test order.|
The fields on the Item FastTab are used for informational purposes only.
|Vendor No.||Vendor from where the test device was purchased.|
|Vendor Name||Populated from the Name field of the vendor selected in the Vendor No. field.|
|Lot No.||Lot number of the test device.|
|Serial No.||Serial number of the test device.|
|Purchase Price||Purchase price of the test device.|
|Connection to-Item No.||Connection of the test device to an inventory item.|
|Connection to-Item Description||Populated from the Description field from the item selected in the Connection to-Item No. field.|
|Warranty Date||Warranty date of the test device.|
|Inventory No.||Inventory number of the test device.|
The Others FastTab contains additional test device information.
|Read off Precision||Value until which a reading can be specified.|
|Read off Unit||Unit of measure of the Read off Precision.|
|Working Range||Maximum available working range.|
|Manufacturer||Manufacturer of a test device.|
|Selfmade||Indicates if the device has been produced internally.|
|State||Indicates the state of the test device.|
|Certificate||Document path to an internal or external certificate. This document can be accessed by choosing the Display Certificate action on the Process menu.|
|Test Device Group||Opens the Test Device Group list, used to classify test devices.|
|Creation Date / Created by / Last Date Modified / Last Modified by||Test device modification information. These values are automatically determined based on the current date and the active User ID and are non-editable.|
The actions on the Process and Reports menus are described in the following table.
|Process||Test Orders||Opens the Test Order List page, which displays all test orders that have been created for this test device.|
|Display Certificate||Opens the document that has been entered in the Certificate field on the Others FastTab.|
|Create Test Order||Creates an instant test order for the test device (see Instant Testing).|
|Block Test Device||Opens the Block Test Devices batch job (see Block Test Devices).|
|Internal Comments / External Comments||Comments can be used to add notes and remarks about a test device.
- Internal comments are printed on documents that will not leave the company such as test plans.
- External comments will be shown on documents that can be sent to the customer or vendor.
|Reports||Test Device List||Generates the Test Device List report for preview or printing.|
A test order can be created for the instant testing of a test device by choosing the Create Test Order action on the Process menu in the Test Device Card or Test Devices page. The following events occur when the “Create Test Order” function is run:
The Test Device Card page is updated with the Status to Blocked and the Blocking Reason to Instant Testing.
The Test Order/Value Recording Card page opens with the Status set to Value Recording for instant testing.
A Default Test Plan must be specified on the Test Device Card to create an instant test order.
The Status on the Test Device is reset to Certified when the test is finished with an Inspection Result of Items are OK and the Blocking Reason field is cleared. Additionally, the Last Tester field is populated with the ID of the user who finished the test order and the Last Test Date field is updated accordingly.
Block Test Devices
Test devices are subject to the test cycles specified on the Test Device Card (see Testing FastTab). The “Block Test Devices” batch job blocks test devices that are out of use or create test orders for test devices that need to be calibrated. This batch job is accessed from the Process menu of the Test Device Card page or Tell Me. Choose the icon, enter Block Test Devices, and then choose the related link.
On the Options FastTab, it is possible to enter a reason for blocking the test device, which is then transferred to the Blocking Reason field on the corresponding Test Device Card. Turn on the Create Test Order toggle to automatically create a test order for all newly blocked test devices.
A Default Test Plan must be specified on the Test Device Card to create a test order.
In the Test Device FastTab, a date interval can be specified. If the date in the Next Date Test Required field on the Test Device Card is within this date interval, a test order will be created for the test device if the Create Test Order toggle is turned on.
If a date is not entered in the Next Date Test Required field, all test devices are blocked after running this batch job.
The “Block Test Devices” function is filtered on the selected Test Device when run from the Test Device Card; therefore, only the selected test device(s) will be blocked.
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